The VTS Program Committee invites original, unpublished paper submissions for VTS 2020. Proposals for the innovative practices and special sessions tracks are also invited. Paper submissions should be complete manuscripts, up to six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status. On the title page, please include: author name(s) and affiliation(s), and the mailing address, phone number, and e-mail address of the contact author. A 50-word abstract and five keywords identifying the topic area are also required.

VTS 2020 will present a Best Paper Award, a Best Special Session Award, and a Best Innovative Practices Session Award based on the evaluations of reviewers, attendees, and an invited panel of judges. We also plan to organize various Student Activities including the TTTC Best Doctoral Thesis Contest, details for which will be made available through the website.

VTS Topics

Analog/Mixed-Signal/RF Test

ATPG & Compression

Silicon Debug

Automotive Test & Safety

Built-In Self-Test (BIST)

Defect & Current Based Test

Defect/Fault Tolerance

Delay & Performance Test

Design for Testability (DFT)

Design Verification/Validation

Embedded System & Board Test

Embedded Test Methods

Emerging Technologies Test


Fault Modeling and Simulation

Hardware Security

Low-Power IC Test

Microsystems/MEMS/Sensors Test

Memory Test and Repair

On-Line Test & Error Correction

Power/Thermal Issues in Test

System-on-Chip (SOC) Test

Test Standards & Economics

Test of Biomedical Devices

Test of High-Speed I/O

Test Quality and Reliability

Test Resource Partitioning

Transients and Soft Errors

2.5D, 3D and SiP Test

Yield Optimization

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